Nonhomogeneous poisson process based software reli ability growth models are generally classified into two
groups. The first group contains models, which use the machine execution time or calendar time as a un it of fault
detection/removal period. Such models are called co ntinuous time models. The second group contains mod els, which use the
number of test occasions/cases asaunitoffaultd etectionperiod.Suchmodelsarecalleddiscreteti memodels,sincetheunit
of software fault detection period is countable. A large number of models have been developed in the f irst group while there
are fewer in the second group. Discrete time models in software reliability are important and a little effort has been made in
this direction. In this paper, we develop two discr ete time SRGMs using probability generating functio n for the software
failure occurrence / fault detection phenomenon bas ed on a NHPP namely, basic and extended models. The basic model
exploitsthefaultdetection/removalrateduringth einitialandfinaltestcases.Whereas,theextendedmodelincorporatesfault
generation and imperfect debugging with learning. A ctual software reliability data have been used to demonstrate the
proposed models. The results are fairly encouraging in terms of goodness-of-fit and predictive validity criteria due to
applicabilityandflexibilityoftheproposedmodel sastheycancaptureawideclassofreliabilitygrowthcurvesrangingfrom
purelyexponentialtohighlyS-shaped.
[1] Bittanti S., Bolzern P., Pedrotti E., Pozzi M., and Scattolini A., Software Reliability Modeling and Identification , Springer!Verlag, USA, 1988.
[2] Brooks D. and Motley W., Analysis of Discrete Software Reliability Models, Technical Report, New York, 1980.
[3] Goel L., Software Reliability Models: Assumptions, Limitations and Applicability, IEEE Transactions on Software Engineering , vol. 11, no. 12, pp. 1411!1423, 1985.
[4] Goel L. and Okumoto K., Time Dependent Error Detection Rate Model for Software Reliability and Other Performance Measures, IEEE Transactions on Reliability , vol. 28, no. 3, pp. 206!211, 1979.
[5] Jelinski Z. and Moranda B., Statistical Computer Performance Evaluation , Academic Press, New York, 1972.
[6] Kapur K., Garg B., and Kumar S., Contributions to Hardware and Software Reliability , World Scientific, New York, 1999.
[7] Kapur K., Shatnawi O., and Yadavalli S., A Software Fault Classification Model, South African Computer Journal , vol. 33, no. 33, pp. 1! 9, 2004.
[8] Kapur K., Singh O., Shatnawi O., and Gupta A., A Discrete Nonhomogeneous Poisson Process Model for Software Reliability Growth with Imperfect Debugging and Fault Generation, International Journal of Performability Engineering , vol. 2, no. 4, pp. 351!368, 2006.
[9] Khoshogoftaar T. and Woodcock G., Software Reliability Model Selection: A Case Study, in Proceedings of the International Symposium on Software Reliability Engineering , pp. 183!191, USA, 1991.
[10] Kuo S., Huang H., and Lyu R., Framework for Modelling Software Reliability Using Various Testing!Effort and Fault!Detection Rates, IEEE Transactions on Reliability , vol. 50, no. 3, pp. 310!320, 2001.
[11] Musa D., Iannino A., and Okumoto K., Software Reliability , McGraw!Hill, New York, 1987.
[12] Ohba M., Software Reliability Analysis Models , IBM Journal of Research and Development , vol. 28, no. 1, pp. 428!443, 1984.
[13] Pham H., Software Reliability , Springer!Verlag, USA, 2000.
[14] Pham H., Nordmann L., and Zhang X., A General Imperfect Software!Debugging Model with S!shaped Fault Detection Rate, IEEE Transactions on Reliability , vol. 48, no. 3, pp. 169!175, 1999.
[15] Shatnawi O., Modelling Software Fault Dependency Using Lag Function, Al Manarah Journal for Research and Studies , vol. 15, no. 6, pp. 261!300, 2007.
[16] Yamada S., Ohba M., and Osaki S., S!shaped Software Reliability Growth Models and Their Applications, IEEE Transactions on Reliability , vol. 33, no. 1, pp. 169!175, 1984.
[17] Yamada S. and Osaki S., Discrete Software Reliability Growth Models, Applied Stochastic Models and Data Analysis , vol. 1, no.1, pp. 65! 77, 1985.
[18] Xie M., Software Reliability Modelling , World Scientific, New York, 1991. Omar Shatnawi received his PhD, in computer science and his MSc in operational research from University of delhi in 2004 and 1999, respectively. Currently, he is head of Department of Information Systems at al!Bayt University. His research interests are in software engineering, wit h an emphasis on improving software reliability and dependability.
Cite this
, " Discrete Time NHPP Models for Software Reliability Growth Phenomenon ", The International Arab Journal of Information Technology (IAJIT) ,Volume 06, Number 02, pp. 6 - 13, April 2009, doi: .
@ARTICLE{4400,
author={},
journal={The International Arab Journal of Information Technology (IAJIT)},
title={ Discrete Time NHPP Models for Software Reliability Growth Phenomenon },
volume={06},
number={02},
pages={6 - 13},
doi={},
year={1970}
}
TY - JOUR
TI - Discrete Time NHPP Models for Software Reliability Growth Phenomenon
T2 -
SP - 6
EP - 13
AU -
DO -
JO - The International Arab Journal of Information Technology (IAJIT)
IS - 9
SN - 2413-9351
VO - 06
VL - 06
JA -
Y1 - Jan 1970
ER -
PY - 1970
, " Discrete Time NHPP Models for Software Reliability Growth Phenomenon ", The International Arab Journal of Information Technology (IAJIT) ,Volume 06, Number 02, pp. 6 - 13, April 2009, doi: .
Abstract: Nonhomogeneous poisson process based software reli ability growth models are generally classified into two
groups. The first group contains models, which use the machine execution time or calendar time as a un it of fault
detection/removal period. Such models are called co ntinuous time models. The second group contains mod els, which use the
number of test occasions/cases asaunitoffaultd etectionperiod.Suchmodelsarecalleddiscreteti memodels,sincetheunit
of software fault detection period is countable. A large number of models have been developed in the f irst group while there
are fewer in the second group. Discrete time models in software reliability are important and a little effort has been made in
this direction. In this paper, we develop two discr ete time SRGMs using probability generating functio n for the software
failure occurrence / fault detection phenomenon bas ed on a NHPP namely, basic and extended models. The basic model
exploitsthefaultdetection/removalrateduringth einitialandfinaltestcases.Whereas,theextendedmodelincorporatesfault
generation and imperfect debugging with learning. A ctual software reliability data have been used to demonstrate the
proposed models. The results are fairly encouraging in terms of goodness-of-fit and predictive validity criteria due to
applicabilityandflexibilityoftheproposedmodel sastheycancaptureawideclassofreliabilitygrowthcurvesrangingfrom
purelyexponentialtohighlyS-shaped. URL: https://iajit.org/paper/4400
@ARTICLE{4400,
author={},
journal={The International Arab Journal of Information Technology (IAJIT)},
title={ Discrete Time NHPP Models for Software Reliability Growth Phenomenon },
volume={06},
number={02},
pages={6 - 13},
doi={},
year={1970}
,abstract={ Nonhomogeneous poisson process based software reli ability growth models are generally classified into two
groups. The first group contains models, which use the machine execution time or calendar time as a un it of fault
detection/removal period. Such models are called co ntinuous time models. The second group contains mod els, which use the
number of test occasions/cases asaunitoffaultd etectionperiod.Suchmodelsarecalleddiscreteti memodels,sincetheunit
of software fault detection period is countable. A large number of models have been developed in the f irst group while there
are fewer in the second group. Discrete time models in software reliability are important and a little effort has been made in
this direction. In this paper, we develop two discr ete time SRGMs using probability generating functio n for the software
failure occurrence / fault detection phenomenon bas ed on a NHPP namely, basic and extended models. The basic model
exploitsthefaultdetection/removalrateduringth einitialandfinaltestcases.Whereas,theextendedmodelincorporatesfault
generation and imperfect debugging with learning. A ctual software reliability data have been used to demonstrate the
proposed models. The results are fairly encouraging in terms of goodness-of-fit and predictive validity criteria due to
applicabilityandflexibilityoftheproposedmodel sastheycancaptureawideclassofreliabilitygrowthcurvesrangingfrom
purelyexponentialtohighlyS-shaped. },
keywords={Software engineering, software testing, software re liability, software reliability growth model, nonhomogeneous
poissonprocess,testoccasions},
ISSN={2413-9351},
month={Jan}}
TY - JOUR
TI - Discrete Time NHPP Models for Software Reliability Growth Phenomenon
T2 -
SP - 6
EP - 13
AU -
DO -
JO - The International Arab Journal of Information Technology (IAJIT)
IS - 9
SN - 2413-9351
VO - 06
VL - 06
JA -
Y1 - Jan 1970
ER -
PY - 1970
AB - Nonhomogeneous poisson process based software reli ability growth models are generally classified into two
groups. The first group contains models, which use the machine execution time or calendar time as a un it of fault
detection/removal period. Such models are called co ntinuous time models. The second group contains mod els, which use the
number of test occasions/cases asaunitoffaultd etectionperiod.Suchmodelsarecalleddiscreteti memodels,sincetheunit
of software fault detection period is countable. A large number of models have been developed in the f irst group while there
are fewer in the second group. Discrete time models in software reliability are important and a little effort has been made in
this direction. In this paper, we develop two discr ete time SRGMs using probability generating functio n for the software
failure occurrence / fault detection phenomenon bas ed on a NHPP namely, basic and extended models. The basic model
exploitsthefaultdetection/removalrateduringth einitialandfinaltestcases.Whereas,theextendedmodelincorporatesfault
generation and imperfect debugging with learning. A ctual software reliability data have been used to demonstrate the
proposed models. The results are fairly encouraging in terms of goodness-of-fit and predictive validity criteria due to
applicabilityandflexibilityoftheproposedmodel sastheycancaptureawideclassofreliabilitygrowthcurvesrangingfrom
purelyexponentialtohighlyS-shaped.